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"Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for ..."
Thomas Edison Yu et al. (2008)
- Thomas Edison Yu, Tomokazu Yoneda, Krishnendu Chakrabarty
, Hideo Fujiwara:
Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips. IEICE Trans. Inf. Syst. 91-D(10): 2440-2448 (2008)

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