"A Low Power Deterministic Test Using Scan Chain Disable Technique."

Zhiqiang You et al. (2006)

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DOI: 10.1093/IETISY/E89-D.6.1931

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/YouIIF06
Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara:
A Low Power Deterministic Test Using Scan Chain Disable Technique. IEICE Trans. Inf. Syst. 89-D(6): 1931-1939 (2006)

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