"A New Solution to Power Supply Voltage Drop Problems in Scan Testing."

Takaki Yoshida, Masafumi Watari (2004)

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type: Journal Article

metadata version: 2020-04-11

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Takaki Yoshida, Masafumi Watari:
A New Solution to Power Supply Voltage Drop Problems in Scan Testing. IEICE Trans. Inf. Syst. 87-D(3): 580-585 (2004)

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