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"A Test Compaction Oriented Don't Care Identification Method Based on X-bit ..."

Hiroshi Yamazaki et al. (2013)

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DOI: 10.1587/TRANSINF.E96.D.1994

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/YamazakiWHY13
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/YamazakiWHY13
Hiroshi Yamazaki, Motohiro Wakazono, Toshinori Hosokawa, Masayoshi Yoshimura:
A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution. IEICE Trans. Inf. Syst. 96-D(9): 1994-2002 (2013)

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