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"RF MOSFET Characterization by Four-Port Measurement."
Shih-Dao Wu et al. (2005)
- Shih-Dao Wu, Guo-Wei Huang, Kun-Ming Chen, Hua-Chou Tseng, Tsun-Lai Hsu, Chun-Yen Chang:
RF MOSFET Characterization by Four-Port Measurement. IEICE Trans. Electron. 88-C(5): 851-856 (2005)
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