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"Improvement in Retention/Program Time Ratio of Direct Tunneling Memory ..."

Kouji Tsunoda et al. (2005)

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DOI: 10.1093/IETELE/E88-C.4.608

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/TsunodaSTNT05
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  - https://dblp.org/rec/journals/ieicet/TsunodaSTNT05
Kouji Tsunoda, Akira Sato, Hiroko Tashiro, Toshiro Nakanishi, Hitoshi Tanaka:
Improvement in Retention/Program Time Ratio of Direct Tunneling Memory (DTM) for Low Power SoC Applications. IEICE Trans. Electron. 88-C(4): 608-613 (2005)

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