"Leakage Current and Floating Gate Capacitor Matching Test."

Weidong Tian, Joe R. Trogolo, Bob Todd (2008)

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DOI: 10.1093/IETELE/E91-C.8.1315

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type: Journal Article

metadata version: 2020-04-11

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Weidong Tian, Joe R. Trogolo, Bob Todd:
Leakage Current and Floating Gate Capacitor Matching Test. IEICE Trans. Electron. 91-C(8): 1315-1320 (2008)

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