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"Prediction of DC-AC Converter Efficiency Degradation due to Device Aging ..."

Kenshiro Sato et al. (2020)

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DOI: 10.1587/TRANSELE.2019ECP5010

access: closed

type: Journal Article

metadata version: 2024-02-05

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  dblp key:
  - journals/ieicet/SatoNSZYMM20
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/SatoNSZYMM20
Kenshiro Sato, Dondee Navarro, Shinya Sekizaki, Yoshifumi Zoka, Naoto Yorino, Hans Jürgen Mattausch, Mitiko Miura-Mattausch:
Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model. IEICE Trans. Electron. 103-C(3): 119-126 (2020)

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