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ORCID"Prediction of Circuit-Performance Variations from Technology Variations ..."
Norio Sadachika et al. (2011)
- Norio Sadachika, Shu Mimura, Akihiro Yumisaki, Koh Johguchi, Akihiro Kaya, Mitiko Miura-Mattausch, Hans Jürgen Mattausch:
Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. IEICE Trans. Electron. 94-C(3): 361-367 (2011)
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