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"A Development of the TFT-LCD Image Defect Inspection Method Based on Human ..."

Jong-Hwan Oh et al. (2008)

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DOI: 10.1093/IETFEC/E91-A.6.1400

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/OhYKP08
Jong-Hwan Oh, Byoung-Ju Yun, Se-Yun Kim, Kil-Houm Park:
A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(6): 1400-1407 (2008)

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