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"Binary Sparse Representation Based on Arbitrary Quality Metrics and Its ..."

Takahiro Ogawa et al. (2018)

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DOI: 10.1587/TRANSFUN.E101.A.1776

access: closed

type: Journal Article

metadata version: 2022-01-12

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  - https://dblp.org/rec/journals/ieicet/OgawaTWTH18
Takahiro Ogawa, Sho Takahashi, Naofumi Wada, Akira Tanaka, Miki Haseyama:
Binary Sparse Representation Based on Arbitrary Quality Metrics and Its Applications. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 101-A(11): 1776-1785 (2018)

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