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"Noise Analysis of GaAs-MESFETs by Physics-Based Circuit Simulator ..."

Masahiro Nakayama, Shinichi Narita, Hiroki I. Fujishiro (2005)

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DOI: 10.1093/IETELE/E88-C.7.1509

access: closed

type: Journal Article

metadata version: 2020-04-11

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Masahiro Nakayama, Shinichi Narita, Hiroki I. Fujishiro:
Noise Analysis of GaAs-MESFETs by Physics-Based Circuit Simulator Employing Monte Carlo Technique. IEICE Trans. Electron. 88-C(7): 1509-1515 (2005)

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