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"A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ..."

Yohei Nakata et al. (2014)

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DOI: 10.1587/TRANSELE.E97.C.332

access: closed

type: Journal Article

metadata version: 2024-03-11

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  - https://dblp.org/rec/journals/ieicet/NakataKOJSTNNYFNKKY14
Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto:
A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation. IEICE Trans. Electron. 97-C(4): 332-341 (2014)

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