"Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope ..."

Takayuki Mori et al. (2018)

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DOI: 10.1587/TRANSELE.E101.C.334

access: closed

type: Journal Article

metadata version: 2023-09-30

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Takayuki Mori, Jiro Ida, Shota Inoue, Takahiro Yoshida:
Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs. IEICE Trans. Electron. 101-C(5): 334-337 (2018)

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