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"Ramp Voltage Testing for Detecting Interconnect Open Faults."

Yukiya Miura (2008)

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DOI: 10.1093/IETISY/E91-D.3.700

access: closed

type: Journal Article

metadata version: 2020-04-11

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Yukiya Miura:
Ramp Voltage Testing for Detecting Interconnect Open Faults. IEICE Trans. Inf. Syst. 91-D(3): 700-705 (2008)

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