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"A New Critical Area Simulation Algorithm and Its Application for Failing ..."

Chizu Matsumoto et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.353

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/MatsumotoHTUMKKK11
Chizu Matsumoto, Yuichi Hamamura, Yoshiyuki Tsunoda, Hiroshi Uozaki, Isao Miyazaki, Shiro Kamohara, Yoshiyuki Kaneko, Kenji Kanamitsu:
A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis. IEICE Trans. Electron. 94-C(3): 353-360 (2011)

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