"FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep ..."

Hochul Lee et al. (2008)

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DOI: 10.1093/IETELE/E91-C.5.776

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type: Journal Article

metadata version: 2020-04-11

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Hochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin:
FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Trans. Electron. 91-C(5): 776-779 (2008)

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