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"Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with ..."

Sang-Youl Lee et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.831

access: closed

type: Journal Article

metadata version: 2023-01-18

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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/LeeYOYJKLL12
Sang-Youl Lee, Seung-Dong Yang, Jae-Sub Oh, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Hi-Deok Lee, Ga-Won Lee:
Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO₂ and S₃N₄ as Trapping Layer. IEICE Trans. Electron. 95-C(5): 831-836 (2012)

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