![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
"Simulation of Gate-All-Around Tunnel Field-Effect Transistor with an ..."
Dong-Seup Lee et al. (2010)
- Dong-Seup Lee, Hong-Seon Yang, Kwon-Chil Kang, Joung-Eob Lee, Jung Han Lee, Seongjae Cho, Byung-Gook Park:
Simulation of Gate-All-Around Tunnel Field-Effect Transistor with an n-Doped Layer. IEICE Trans. Electron. 93-C(5): 540-545 (2010)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.