"A CMOS Built-In Current Sensor for IDDQ Testing."

Jeong Beom Kim, Seung Ho Hong (2006)

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DOI: 10.1093/IETELE/E89-C.6.868

access: closed

type: Journal Article

metadata version: 2020-04-11

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Jeong Beom Kim, Seung Ho Hong:
A CMOS Built-In Current Sensor for IDDQ Testing. IEICE Trans. Electron. 89-C(6): 868-870 (2006)

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