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"Pairwise Test Case Generation Based on Module Dependency."
Jangbok Kim, Kyunghee Choi, Gihyun Jung (2006)
- Jangbok Kim, Kyunghee Choi, Gihyun Jung:
Pairwise Test Case Generation Based on Module Dependency. IEICE Trans. Inf. Syst. 89-D(11): 2811-2813 (2006)
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