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"Reliability of Generalized Normal Laplacian Distribution Model in TH-BPSK ..."

Sangchoon Kim (2011)

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DOI: 10.1587/TRANSFUN.E94.A.1772

access: closed

type: Journal Article

metadata version: 2020-04-11

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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/Kim11g
Sangchoon Kim:
Reliability of Generalized Normal Laplacian Distribution Model in TH-BPSK UWB Systems. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(8): 1772-1775 (2011)

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