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"Evaluation of Surface States of AlGaN/GaN HFET Using Open-Gated Structure."

Daigo Kikuta, Jin-Ping Ao, Yasuo Ohno (2005)

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DOI: 10.1093/IETELE/E88-C.4.683

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/KikutaAO05
Daigo Kikuta, Jin-Ping Ao, Yasuo Ohno:
Evaluation of Surface States of AlGaN/GaN HFET Using Open-Gated Structure. IEICE Trans. Electron. 88-C(4): 683-689 (2005)

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