"Two-Tone Signal Generation for ADC Testing."

Keisuke Kato et al. (2013)

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DOI: 10.1587/TRANSELE.E96.C.850

access: closed

type: Journal Article

metadata version: 2023-03-21

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Keisuke Kato, Fumitaka Abe, Kazuyuki Wakabayashi, Chuan Gao, Takafumi Yamada, Haruo Kobayashi, Osamu Kobayashi, Kiichi Niitsu:
Two-Tone Signal Generation for ADC Testing. IEICE Trans. Electron. 96-C(6): 850-858 (2013)

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