"Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection ..."

Young-Bok Joo, Chan-Ho Han, Kil-Houm Park (2010)

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DOI: 10.1587/TRANSELE.E93.C.922

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/JooHP10
Young-Bok Joo, Chan-Ho Han, Kil-Houm Park:
Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System. IEICE Trans. Electron. 93-C(6): 922-928 (2010)

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