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"Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI ..."

Jae-Hyung Jang et al. (2013)

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DOI: 10.1587/TRANSELE.E96.C.624

access: closed

type: Journal Article

metadata version: 2022-10-02

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/JangKKKHSSCLL13
Jae-Hyung Jang, Hyuk-Min Kwon, Ho-Young Kwak, Sung-Kyu Kwon, Seon-Man Hwang, Jong-Kwan Shin, Seung-Yong Sung, Yi-Sun Chung, Da-Soon Lee, Hi-Deok Lee:
Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs. IEICE Trans. Electron. 96-C(5): 624-629 (2013)

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