"Randomness Test to Solve Discrete Fourier Transform Test Problems."

Atsushi Iwasaki, Ken Umeno (2018)

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DOI: 10.1587/TRANSFUN.E101.A.1204

access: closed

type: Journal Article

metadata version: 2020-09-05

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Atsushi Iwasaki, Ken Umeno:
Randomness Test to Solve Discrete Fourier Transform Test Problems. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 101-A(8): 1204-1214 (2018)

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