![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
"Evaluation of Information Leakage from Cryptographic Hardware via ..."
Yu-ichi Hayashi et al. (2012)
- Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki
, Takeshi Sugawara
, Yoshiki Kayano, Takafumi Aoki, Shigeki Minegishi, Akashi Satoh, Hideaki Sone, Hiroshi Inoue:
Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current. IEICE Trans. Electron. 95-C(6): 1089-1097 (2012)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.