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"Characterization of Electron Field Emission from Multiple-Stacking ..."
Yuto Futamura et al. (2019)
- Yuto Futamura, Katsunori Makihara, Akio Ohta, Mitsuhisa Ikeda, Seiichi Miyazaki:
Characterization of Electron Field Emission from Multiple-Stacking Si-Based Quantum Dots. IEICE Trans. Electron. 102-C(6): 458-461 (2019)
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