"Test-Retest Reliability and Criterion-Related Validity of the Implicit ..."

Tsutomu Fujii, Takafumi Sawaumi, Atsushi Aikawa (2013)

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DOI: 10.1587/TRANSFUN.E96.A.1768

access: closed

type: Journal Article

metadata version: 2021-10-14

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Tsutomu Fujii, Takafumi Sawaumi, Atsushi Aikawa:
Test-Retest Reliability and Criterion-Related Validity of the Implicit Association Test for Measuring Shyness. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 96-A(8): 1768-1774 (2013)

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