"Circuit Performance Degradation of Switched-Capacitor Circuit with ..."

Jung-Sheng Chen, Ming-Dou Ker (2008)

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DOI: 10.1093/IETELE/E91-C.3.378

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type: Journal Article

metadata version: 2020-04-11

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Jung-Sheng Chen, Ming-Dou Ker:
Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process. IEICE Trans. Electron. 91-C(3): 378-384 (2008)

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