"Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme ..."

Jinsoo Bae et al. (2010)

> Home

Details and statistics

DOI: 10.1587/TRANSFUN.E93.A.2045

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/BaePKYOSO10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/BaePKYOSO10
Jinsoo Bae, Seong Ill Park, Yun Hee Kim, Seokho Yoon, Jongho Oh, Iickho Song, Seong-Jun Oh:
Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(11): 2045-2056 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.