"Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering."

Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki (2018)

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DOI: 10.1587/TRANSFUN.E101.A.2262

access: closed

type: Journal Article

metadata version: 2020-04-11

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Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki:
Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 101-A(12): 2262-2270 (2018)

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