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"A scan disabling-based BAST scheme for test cost reduction."
Zhiqiang You et al. (2011)
- Zhiqiang You, Weizheng Wang, Zhiping Dou, Peng Liu, Jishun Kuang:
A scan disabling-based BAST scheme for test cost reduction. IEICE Electron. Express 8(16): 1367-1373 (2011)
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