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"Power, performance, and area evaluation across 180nm-28nm technology nodes ..."

Minghui Yin et al. (2024)

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DOI: 10.1587/ELEX.21.20240194

access: open

type: Journal Article

metadata version: 2024-05-18

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  - https://dblp.org/rec/journals/ieiceee/YinLZLZYW24
Minghui Yin, Zhiqiang Li, Weihua Zhang, Hongwei Liu, Huanhuan Zhou, Yunxia You, Chen Wang:
Power, performance, and area evaluation across 180nm-28nm technology nodes based on benchmark circuits. IEICE Electron. Express 21: 20240194 (2024)

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