"Word line interference based data recovery technique for 3D NAND Flash."

Liu Yang et al. (2018)

> Home

Details and statistics

DOI: 10.1587/ELEX.15.20180762

access: open

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ieiceee/YangLCWH18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/YangLCWH18
Liu Yang, Fei Liu, Huamin Cao, Qi Wang, Zongliang Huo:
Word line interference based data recovery technique for 3D NAND Flash. IEICE Electron. Express 15(19): 20180762 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.