"Phase difference analysis technique for parametric faults BIST in CMOS ..."

Chatchai Wannaboon et al. (2018)

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DOI: 10.1587/ELEX.15.20180175

access: open

type: Journal Article

metadata version: 2022-10-02

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Chatchai Wannaboon, Nattagit Jiteurtragool, Wimol San-Um, Masayoshi Tachibana:
Phase difference analysis technique for parametric faults BIST in CMOS analog circuits. IEICE Electron. Express 15(9): 20180175 (2018)

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