default search action
"Diffusion-rounded CMOS for improving both Ion and ..."
Myunghwan Ryu, Hung Viet Nguyen, Youngmin Kim (2011)
- Myunghwan Ryu, Hung Viet Nguyen, Youngmin Kim:
Diffusion-rounded CMOS for improving both Ion and Ioff characteristics. IEICE Electron. Express 8(21): 1783-1788 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.