"Characterization of the gate-voltage dependency of input capacitance in a ..."

Nathabhat Phankong, Tsuyoshi Funaki, Takashi Hikihara (2010)

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DOI: 10.1587/ELEX.7.480

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/PhankongFH10
Nathabhat Phankong, Tsuyoshi Funaki, Takashi Hikihara:
Characterization of the gate-voltage dependency of input capacitance in a SiC MOSFET. IEICE Electron. Express 7(7): 480-486 (2010)

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