default search action
"Channel thickness dependence on InGaAs MOSFET with n-InP source for high ..."
Kazuto Ohsawa et al. (2014)
- Kazuto Ohsawa, Atsushi Kato, Toru Kanazawa, Eiji Uehara, Yasuyuki Miyamoto:
Channel thickness dependence on InGaAs MOSFET with n-InP source for high current density. IEICE Electron. Express 11(14): 20140567 (2014)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.