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ORCID"Temperature-dependent characterizations on parasitic capacitance of ..."
Yang Liu et al. (2018)
- Yang Liu, Zhangming Zhu, Xiaoxian Liu, Huaxi Gu, Lixin Guo:
Temperature-dependent characterizations on parasitic capacitance of tapered through silicon via (T-TSV). IEICE Electron. Express 15(24): 20180878 (2018)
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