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"Mitigating the SERs of large combinational circuits by using half guard ..."

Bin Liang, Yankang Du, Hui Xu (2014)

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DOI: 10.1587/ELEX.11.20140710

access: open

type: Journal Article

metadata version: 2021-02-12

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  dblp key:
  - journals/ieiceee/LiangDX14
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  - https://dblp.org/rec/journals/ieiceee/LiangDX14
Bin Liang, Yankang Du, Hui Xu:
Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology. IEICE Electron. Express 11(19): 20140710 (2014)

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