"Machine learning model for predicting threshold voltage by taper angle ..."

Dong Chan Lee, Jang Kyu Lee, Hyungcheol Shin (2020)

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DOI: 10.1587/ELEX.17.20200345

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/LeeLS20
Dong Chan Lee, Jang Kyu Lee, Hyungcheol Shin:
Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory. IEICE Electron. Express 17(22): 20200345 (2020)

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