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"The design of high holding voltage SCR for whole-chip ESD protection."

Yong-Seo Koo et al. (2008)

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DOI: 10.1587/ELEX.5.624

access: open

type: Journal Article

metadata version: 2021-02-12

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  dblp key:
  - journals/ieiceee/KooLKK08
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  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/KooLKK08
Yong-Seo Koo, Kwang-Yeob Lee, Kui-Dong Kim, Jong-Ki Kwon:
The design of high holding voltage SCR for whole-chip ESD protection. IEICE Electron. Express 5(17): 624-630 (2008)

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