"Cold- and hot-switching lifetime characterizations of ohmic-contact RF ..."

Jong-Man Kim et al. (2008)

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DOI: 10.1587/ELEX.5.418

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/KimLBKK08
Jong-Man Kim, Sanghyo Lee, Chang-Wook Baek, Youngwoo Kwon, Yong-Kweon Kim:
Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches. IEICE Electron. Express 5(11): 418-423 (2008)

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