"Thermal effect on dynamic Ron degradation of p-GaN AlGaN/GaN ..."

Manqing Hu et al. (2020)

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DOI: 10.1587/ELEX.17.20200255

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/HuLDM20
Manqing Hu, Gengxin Liu, E. Du, Feiyan Mu:
Thermal effect on dynamic R_on degradation of p-GaN AlGaN/GaN HEMTs on SiC substrates. IEICE Electron. Express 17(17): 20200255 (2020)

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