"Single event effect mechanism study in 130nm fully depleted SOI technology ..."

Rui Chen et al. (2024)

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DOI: 10.1587/ELEX.21.20240434

access: open

type: Journal Article

metadata version: 2024-11-27

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Rui Chen, Ziyu Wang, Sai Li, Jianwei Han, Yanan Liang, Qian Chen, Shipeng Shangguan, Runjie Yuan:
Single event effect mechanism study in 130nm fully depleted SOI technology devices. IEICE Electron. Express 21(19): 20240434 (2024)

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