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"A Deep Residual PLS for Data-Driven Quality Prediction Modeling in ..."

Xiaofeng Yuan et al. (2024)

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DOI: 10.1109/JAS.2024.124578

access: closed

type: Journal Article

metadata version: 2024-08-05

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  - https://dblp.org/rec/journals/ieeejas/YuanXWYG24
Xiaofeng Yuan, Weiwei Xu, Yalin Wang, Chunhua Yang, Weihua Gui:
A Deep Residual PLS for Data-Driven Quality Prediction Modeling in Industrial Process. IEEE CAA J. Autom. Sinica 11(8): 1777-1785 (2024)

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