"How test suites impact fault localisation starting from the size."

Yan Lei et al. (2018)

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DOI: 10.1049/IET-SEN.2017.0026

access: open

type: Journal Article

metadata version: 2022-03-09

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Yan Lei, Chengnian Sun, Xiaoguang Mao, Zhendong Su:
How test suites impact fault localisation starting from the size. IET Softw. 12(3): 190-205 (2018)

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