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"Evaluation of the machine learning classifier in wafer defects classification."

Jessnor Arif Mat-Jizat et al. (2021)

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DOI: 10.1016/J.ICTE.2021.04.007

access: open

type: Journal Article

metadata version: 2021-12-25

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  dblp key:
  - journals/ict-express/Mat-JizatMNTY21
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  - https://dblp.org/rec/journals/ict-express/Mat-JizatMNTY21
Jessnor Arif Mat-Jizat, Anwar P. P. Abdul Majeed, Ahmad Fakhri Ab. Nasir, Zahari Taha, Edmund Yuen:
Evaluation of the machine learning classifier in wafer defects classification. ICT Express 7(4): 535-539 (2021)

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